ELLIPSOMETRIC METHOD FOR MEASURING DISPERSION AND THICKNESS OF TRANSPARENT FILMS ON METAL SUBSTRATES

被引：0
|
作者：
SHKLYAREVSKII, IN
ELSHAZLI, AF
IDCHAK, E
机构：
来源：
OPTIKA I SPEKTROSKOPIYA | 1972年 / 33卷 / 06期
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
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页码：1157 / 1161
页数：5
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