ELLIPSOMETRIC METHOD FOR MEASURING DISPERSION AND THICKNESS OF TRANSPARENT FILMS ON METAL SUBSTRATES

被引：0

|

作者：

SHKLYAREVSKII, IN

ELSHAZLI, AF

IDCHAK, E

机构：

来源：

OPTIKA I SPEKTROSKOPIYA | 1972年 / 33卷 / 06期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：1157 / 1161

页数：5

相关论文

共 50 条

[1] ELLIPSOMETRIC METHOD FOR MEASUREMENT OF OPTICAL-CONSTANTS AND THICKNESS OF THIN ABSORBING FILMS ON METAL SUBSTRATES
SHKLYAREVSKII, IN
ELSHAZLI, AF
YAROVAYA, RG
KOSTYUK, VP
OPTIKA I SPEKTROSKOPIYA, 1974, 36 (01): : 199 - 204
[2] OPTICAL METHOD OF MEASURING THE THICKNESS OF TRANSPARENT AND SEMITRANSPARENT FILMS
KASHIRSKII, IM
BULYSHEV, YS
SINITSKII, VV
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1982, 25 (02) : 496 - 497
[3] METHOD OF MEASURING THICKNESS AND REFRACTIVE INDEX FOR THIN TRANSPARENT FILMS
KORSHUNOV, VD
PILIN, YG
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1966, (06): : 1455 - +
[4] Instrument for measuring the thickness of transparent films
Fedortsov, AB
Letenko, DG
Churkin, YV
Torchinskii, IA
Ivanov, AS
RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING, 1995, 31 (06) : 418 - 422
[5] MEASURING REFRACTIVE-INDEX AND THICKNESS OF THIN TRANSPARENT FILMS - METHOD
DANEU, V
SANCHEZ, A
APPLIED OPTICS, 1974, 13 (01): : 122 - 128
[6] ELLIPSOMETRICAL METHOD FOR DETERMINATION OF THICKNESS AND DISPERSION OF OPTICAL-CONSTANTS OF THIN ABSORBING FILMS EVAPORATED ON METAL SUBSTRATES
SHKLYAREVSKII, IN
ELSHAZLY, AF
KOSTYUK, VP
SOLID STATE COMMUNICATIONS, 1972, 10 (11) : 1045 - +
[7] An ellipsometric method for measuring the parameters of thin magnetic films
Bakradze, OI
JOURNAL OF OPTICAL TECHNOLOGY, 2005, 72 (02) : 225 - 226
[8] Sensitivity of the thermocapillary method of thickness determination for transparent liquid films on horizontal absorbing substrates
B. A. Bezuglyi
O. A. Tarasov
Technical Physics Letters, 2004, 30 : 138 - 140
[9] Sensitivity of the thermocapillary method of thickness determination for transparent liquid films on horizontal absorbing substrates
Bezuglyi, BA
Tarasov, OA
TECHNICAL PHYSICS LETTERS, 2004, 30 (02) : 138 - 140
[10] INTERPRETATION OF ELLIPSOMETRIC DATA FOR TRANSPARENT FILMS ON ROUGH METAL-SURFACES
SMITH, T
LINDBERG, G
SURFACE TECHNOLOGY, 1979, 8 (01): : 1 - 35

← 1 2 3 4 5 →