EXTENDED TRIPLE NODES AND CALCULATION OF STACKING-FAULT ENERGY

被引：0
|
作者：
MILON, P [1 ]
VILLAIN, JP [1 ]
机构：
[1] CNRS,MET PHYS LAB,F-86022 POITIERS,FRANCE
来源：
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1978年 / 3卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：A7 / A7
页数：1
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