EFFECT OF ENDLESS BURN-IN ON RELIABILITY GROWTH PROJECTIONS

被引：0
|
作者：
BEZAT, AG
MONTAGUE, LL
机构：
来源：
PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM | 1979年 / NSYM期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：392 / 397
页数：6
相关论文
共 50 条
  • [31] THE BURN-IN SCANDAL
    不详
    IEEE SPECTRUM, 1984, 21 (06) : 16 - 16
  • [32] Burn-in and covariates
    Ebrahimi, N
    JOURNAL OF APPLIED PROBABILITY, 2004, 41 (03) : 735 - 745
  • [33] BURN-IN FOR LIFE
    FLETCHER, P
    ENGINEERING, 1974, 214 (05): : 364 - 366
  • [34] Determining the effect of burn-in process on reliability of X7R multilayer ceramic capacitors
    Pedram Yousefian
    Clive A. Randall
    Journal of Materials Science, 2022, 57 : 15913 - 15918
  • [35] Considering "after burn-in failure treatment" in determining optimal burn-in
    Liu, Xin
    Mazzuchi, Thomas A.
    TWELFTH ISSAT INTERNATIONAL CONFERENCE RELIABILITY AND QUALITY IN DESIGN, PROCEEDINGS, 2006, : 92 - +
  • [36] Effect of current burn-in on life of impulse capacitors
    Huang, Bin
    Lin, Fuchang
    Yao, Zonggan
    Dai, Xin
    Peng, Xudong
    Gaodianya Jishu/High Voltage Engineering, 2000, 26 (03): : 21 - 22
  • [37] Burn-in effect on GaInP heterojunction bipolar transistors
    Mimila-Arroyo, J
    APPLIED PHYSICS LETTERS, 2003, 83 (15) : 3204 - 3206
  • [38] EFFECT OF BURN-IN ON MEAN RESIDUAL LIFE.
    Park, Kyung S.
    IEEE Transactions on Reliability, 1985, R-34 (05) : 522 - 523
  • [39] Reliability Optimization of Uncertain Random Systems Combined With Burn-In and Preventive Maintenance
    Xu, Qinqin
    Zhu, Yuanguo
    IEEE TRANSACTIONS ON RELIABILITY, 2023, 72 (03) : 1134 - 1146
  • [40] Hydrogen-related burn-in in GaAs/AlGaAs HBTs and implications for reliability
    Henderson, T
    Ley, V
    Kim, T
    Moise, T
    Hill, D
    IEDM - INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST 1996, 1996, : 203 - 206
12345