EXPERIMENTAL MTF MEASUREMENTS OF CCD USING AN INTERFEROMETRICALLY GENERATED TEST PATTERN

被引:0
|
作者
JOHANSSON, S
LEBEDINSKY, YA
PREDKO, KG
机构
来源
JOURNAL OF IMAGING SCIENCE | 1991年 / 35卷 / 05期
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暂无
中图分类号
TB8 [摄影技术];
学科分类号
0804 ;
摘要
A quick, computerized method to measure and characterize the performance of charge-coupled device arrays is demonstrated, theoretically and experimentally. A sinusoidal test pattern is generated interferometrically directly on the charge-coupled device array surface. The coherent illumination causes a "ghost image", which is generated by self-interference between the illumination and its reflections in the charge-coupled device surface and the surfaces of the covering glass. The influence of this self-interference pattern is investigated; it can be neglected if proper settings of the illumination are performed. Finally, the influence of the use of frame-grabbers is discussed.
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页码:320 / 325
页数:6
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