CONDENSATION OF INDIUM FILMS ON SILICON SUBSTRATES OBSERVED BY MASS-SPECTROMETRIC TECHNIQUE

被引:0
|
作者
ANH, NTT
CHAKRAVE.BK
CINTI, R
机构
关键词
D O I
暂无
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:174 / &
相关论文
共 50 条
  • [21] MASS-SPECTROMETRIC STUDIES OF GOLD-SILICON INTERFACE CONTAMINATION
    WEY, SJ
    LEWIS, G
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (02): : 413 - 415
  • [22] MASS-SPECTROMETRIC INVESTIGATION OF SILICON-CONTAINING CYCLIC POLYSULFIDES
    MIKAYA, AI
    TRUSOVA, EA
    ZAIKIN, VG
    TYURIN, VD
    KUZMIN, OV
    LEBEDEV, AV
    JOURNAL OF ORGANOMETALLIC CHEMISTRY, 1983, 256 (01) : 97 - 102
  • [23] MASS-SPECTROMETRIC DETERMINATION OF SPIN ADDUCTS IN SPIN TRAPPING TECHNIQUE
    SUEZAWA, H
    ABE, K
    HIROTA, M
    ISHII, T
    CHEMISTRY LETTERS, 1981, (07) : 1049 - 1052
  • [24] SECONDARY ION MASS-SPECTROMETRIC STUDY OF DISSOLVED SILVER AND INDIUM IN SULFIDE MINERALS
    MCINTYRE, NS
    CABRI, LJ
    CHAUVIN, WJ
    LAFLAMME, JHG
    SCANNING ELECTRON MICROSCOPY, 1984, : 1139 - 1146
  • [25] MASS-SPECTROMETRIC METHOD FOR INVESTIGATION OF GAS PERMEABILITY OF POLYMER FILMS
    IVASHCHENKO, DA
    TALAKIN, OG
    KROTOV, VA
    FUKS, EV
    VYSOKOMOLEKULYARNYE SOEDINENIYA SECTION A, 1972, 14 (09): : 2109 - +
  • [26] MASS-SPECTROMETRIC INVESTIGATION OF POLY(3-METHYLTHIOPHENE) FILMS
    KOBEL, W
    KIESS, H
    EGLI, M
    KELLER, R
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1986, 192 : 390 - INOR
  • [27] MASS-SPECTROMETRIC DETECTION OF PRE-CONDENSATION NUCLEI AT THE ARTIC SUMMER MESOPAUSE
    BJORN, LG
    ARNOLD, F
    GEOPHYSICAL RESEARCH LETTERS, 1981, 8 (11) : 1167 - 1170
  • [28] INVESTIGATION OF ALUMINUM-OXIDE FILMS BY MASS-SPECTROMETRIC AND IR-SPECTROMETRIC METHODS
    GROMOVA, SN
    NIKOLAEVA, EA
    PROKOFEV, EV
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1989, 56 (11): : 667 - 670
  • [29] MASS-SPECTROMETRIC STUDIES OF PLASMA-ETCHING OF SILICON-NITRIDE
    CLARKE, PE
    FIELD, D
    HYDES, AJ
    KLEMPERER, DF
    SEAKINS, MJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (06): : 1614 - 1619
  • [30] MASS-SPECTROMETRIC ANALYSIS DURING VAPOR-DEPOSITION OF AMORPHOUS SILICON
    MELL, H
    BRODSKY, MH
    THIN SOLID FILMS, 1977, 46 (03) : 299 - 305