HETEROEPITAXIAL GROWTH OF CEO2(001) FILMS ON SI(001) SUBSTRATES BY PULSED LASER DEPOSITION IN ULTRAHIGH-VACUUM

被引:66
|
作者
NAGATA, H
TSUKAHARA, T
GONDA, S
YOSHIMOTO, M
KOINUMA, H
机构
[1] The Research Laboratory of Engineering Materials, Tokyo Institute of Technology, Yokohama-shi Kanagawa, 227, Nagatsuta-cho 4259, Midori-ku
关键词
LASER MBE; CEO2; SRTIO3; SI; EPITAXIAL FILM; LATTICE ENGINEERING;
D O I
10.1143/JJAP.30.L1136
中图分类号
O59 [应用物理学];
学科分类号
摘要
Pulsed laser deposition in ultrahigh vacuum (UHV) was applied to the epitaxial growth of CeO2 film on Si(001). Although the direct deposition of CeO2(001) on Si(001) was unsuccessful, the desired epitaxy was achieved by inserting the growth of a SrTiO3 layer. The formation of a CeO2(001) parallel-to SrTiO3(001) parallel-to Si(001) layered structure was verified by reflection high-energy electron diffraction analysis of the growing surface at a temperature between 650 and 700-degrees-C in UHV. In addition to lattice matching, chemical interaction at the growing surface had a decisive effect on the epitaxy and orientation of growing ceramic lattices.
引用
收藏
页码:L1136 / L1138
页数:3
相关论文
共 50 条
  • [31] Effects of oxygen partial pressure and laser energy density on the heteroepitaxial growth of YSZ on Si(001) by pulsed laser deposition
    Yamada, T
    Wakiya, N
    Shinozaki, K
    Mizutani, N
    JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 2000, 108 (08) : 777 - 779
  • [32] HETEROEPITAXIAL GROWTH OF CEO2 FILM ON GAAS(001) SUBSTRATE BY LASER MOLECULAR-BEAM EPITAXY
    NAGATA, H
    YOSHIMOTO, M
    KOINUMA, H
    JOURNAL OF CRYSTAL GROWTH, 1992, 118 (3-4) : 299 - 303
  • [33] Characterization of defect type and dislocation density in double oxide heteroepitaxial CeO2/YSZ/Si(001) films
    Chen, CH
    Kiguchi, T
    Saiki, A
    Wakiya, N
    Shinozaki, K
    Mizutani, N
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2003, 76 (06): : 969 - 973
  • [34] CeO2 thin films on Si(100) obtained by pulsed laser deposition
    Cossarutto, L
    Chaoui, N
    Millon, E
    Muller, JF
    Lambert, J
    Alnot, M
    APPLIED SURFACE SCIENCE, 1998, 126 (3-4) : 352 - 355
  • [35] Characterization of defect type and dislocation density in double oxide heteroepitaxial CeO2/YSZ/Si(001) films
    C.H. Chen
    T. Kiguchi
    A. Saiki
    N. Wakiya
    K. Shinozaki
    N. Mizutani
    Applied Physics A, 2003, 76 : 969 - 973
  • [36] Heteroepitaxial growth of RuO2 thin films on α-Al2O3 substrates with CeO2 buffer layers by pulsed laser deposition
    Chen, CL
    Jia, QX
    Lu, YC
    Smith, JL
    Mitchell, TE
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1998, 16 (04): : 2725 - 2727
  • [37] Temperature dependence of La2Hf2O7 thin films growth on Si(001) substrates by pulsed laser deposition
    Wei, Feng
    Tu, Hailing
    Wang, Yi
    Yue, Shoujing
    Du, Jun
    JOURNAL OF CRYSTAL GROWTH, 2008, 310 (18) : 4065 - 4068
  • [38] Reactive sputter deposition of epitaxial (001)CeO2 on (001)Ge
    Patel, M
    Kim, K
    Ivill, M
    Budai, JD
    Norton, DP
    THIN SOLID FILMS, 2004, 468 (1-2) : 1 - 3
  • [39] Epitaxial growth of HfO2 doped CeO2 thin films on Si(001) substrates for high-κ application
    Wang, Yi
    Wei, Feng
    Yue, Shoujing
    Yang, Zhimin
    Du, Jun
    APPLIED PHYSICS LETTERS, 2008, 92 (01)
  • [40] Study of the epitaxial growth of CeO2(001) on yttria-stabilized zirconia/Si(001)
    Trtik, V
    Aguiar, R
    Sanchez, F
    Ferrater, C
    Varela, M
    JOURNAL OF CRYSTAL GROWTH, 1998, 192 (1-2) : 175 - 184