CHARACTERIZATION OF THE PERTURBATION EFFECT OF A PROBE HEAD USING THE FD-TD METHOD

被引：2
|
作者：
QIAN, YX
IWATA, S
机构：
[1] University of Electro-Communications, Tokyo
来源：
IEEE MICROWAVE AND GUIDED WAVE LETTERS | 1994年 / 4卷 / 10期
关键词：
D O I：
10.1109/75.324702
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The perturbation effect of a probe head in microwave measurement is investigated by using the FD-TD method. A two-simulation approach with improved accuracy is employed to predict the insertion loss caused by the probe head. Depending on the diameter and reclining angle of the probe head, a maximum insertion insertion loss of up to 0.8 dB has been calculated for an example structure. This work provides a rigorous and quantitative estimation of the probe effect. The analysis results may also serve as a guidance for optimal designing and positioning of probe heads so that a minimum field perturbation during measurement can be expected.
引用
收藏
页码：317 / 319
页数：3
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