In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's.(1) The efficiency of our method is illustrated by experimental results for a set of benchmark circuits.
机构:
Department of Bioengineering, University of Washington, Seattle, WA 98195-5061, William H. Foege BuildingDepartment of Bioengineering, University of Washington, Seattle, WA 98195-5061, William H. Foege Building
Kim K.H.
Sauro H.M.
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机构:
Department of Bioengineering, University of Washington, Seattle, WA 98195-5061, William H. Foege BuildingDepartment of Bioengineering, University of Washington, Seattle, WA 98195-5061, William H. Foege Building