RELIABILITY OF SEMICONDUCTOR DEVICES FOR DIPS-1

被引：0
|
作者：
ANAYAMA, H
TERASAKI, Y
SHIKAMA, S
NAKAMURA, M
机构：
[1] NIPPON ELECT CO LTD,ELECTR DIVICE GRP,TOKYO,JAPAN
[2] NIPPON ELECT CO LTD,ELECT DIVICE GRP,TOKYO,JAPAN
[3] NIPPON ELECT CO LTD,QUAL CONTROL DEPT,IC DIV,TOKYO,JAPAN
[4] MUSASHINO ELECT COMMUN LAB,ELECTR EQUIPMENT DEV DIV,CIRCUIT COMPONENT SECT,MUSASHINO,TOKYO,JAPAN
[5] MUSASHINO ELECT COMMUN LAB,ENGN DIV,COMPONENT ENGN SECT,MUSASHINO,TOKYO,JAPAN
来源：
REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES | 1973年 / 21卷 / 3-4期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：211 / 213
页数：3
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