FIELD CALIBRATION OF REFERENCE REFLECTANCE PANELS

被引:95
|
作者
JACKSON, RD [1 ]
MORAN, MS [1 ]
SLATER, PN [1 ]
BIGGAR, SF [1 ]
机构
[1] UNIV ARIZONA,CTR OPT SCI,TUCSON,AZ 85721
关键词
D O I
10.1016/0034-4257(87)90032-0
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
引用
收藏
页码:145 / 158
页数:14
相关论文
共 50 条
  • [31] CALIBRATION OF INSTRUMENTS FOR MEASURING REFLECTANCE AND TRANSMITTANCE
    BENNETT, JM
    ASHLEY, EJ
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (05) : 681 - &
  • [32] CALIBRATION OF INSTRUMENTS MEASURING REFLECTANCE AND TRANSMITTANCE
    BENNETT, JM
    ASHLEY, EJ
    APPLIED OPTICS, 1972, 11 (08): : 1749 - &
  • [33] Single fiber reflectance spectroscopy calibration
    Zhang, Xu U.
    Post, Anouk L.
    Faber, Dirk J.
    van Leeuwen, Ton G.
    Sterenborg, Henricus J. C. M.
    JOURNAL OF BIOMEDICAL OPTICS, 2017, 22 (10)
  • [34] SWIR CALIBRATION OF SPECTRALON REFLECTANCE FACTOR
    Georgiev, Georgi T.
    Butler, James J.
    Cooksey, Catherine
    Ding, Leibo
    Thome, Kurtis J.
    SENSORS, SYSTEMS, AND NEXT-GENERATION SATELLITES XV, 2011, 8176
  • [35] ABSOLUTE REFLECTANCE FACTOR CALIBRATION FOR GONIOSPECTROPHOTOMETRY
    FAIRCHILD, MD
    DAOUST, DJO
    PETERSON, J
    BERNS, RS
    COLOR RESEARCH AND APPLICATION, 1990, 15 (06): : 311 - 320
  • [36] Reference electrode calibration
    不详
    MATERIALS PERFORMANCE, 2000, 39 (08) : 36 - 36
  • [37] Comparison of three calibration procedures for free-field reference speech audiometry
    de Vaate, Mieke Janssens-bij
    Rhebergen, Koenraad S.
    INTERNATIONAL JOURNAL OF AUDIOLOGY, 2024, 63 (07) : 527 - 534
  • [38] Calibration of electric field probes in GTEM cell using reference antenna method
    Wu, Ifong
    Ishigami, Shinobu
    Gotoh, Kaoru
    Matsumoto, Yasushi
    IEICE ELECTRONICS EXPRESS, 2009, 6 (20): : 1469 - 1475
  • [39] Assessment of a dynamic reference material for calibration of full-field measurement systems
    Hack, Erwin
    Feligiotti, Mara
    Davighi, Andrea
    Whelan, Maurice
    Wang, Weizhuo Victor
    Patterson, Eann A.
    SPECKLE 2012: V INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY, 2012, 8413
  • [40] Measuring Irradiance With Bifacial Reference Panels
    Riedel-Lyngskaer, Nicholas
    Bartholomaus, Martin
    Vedde, Jan
    Poulsen, Peter Behrensdorff
    Spataru, Sergiu
    IEEE JOURNAL OF PHOTOVOLTAICS, 2022, 12 (06): : 1324 - 1333