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- [3] A new method for determining the sharpness of InGaAs/GaAs heterojunctions by auger depth profiling Technical Physics Letters, 2001, 27 : 868 - 870
- [5] NEW APPROACHES FOR NEUTRON DEPTH PROFILING JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES, 1994, 180 (02): : 255 - 262
- [7] Application of a new algorithm to depth profiling by PIXE NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 103 (04): : 489 - 493
- [8] A new technique for depth profiling on a nanometer scale SURFACE/INTERFACE AND STRESS EFFECTS IN ELECTRONIC MATERIALS NANOSTRUCTURES, 1996, 405 : 407 - 412
- [10] Electrochemical isothermal-capacitance-transient spectroscopy: A new depth profiling method of deep levels REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (09):