ANALYSIS OF MICROWAVE DE-EMBEDDING ERRORS

被引:7
|
作者
GLASSER, LA [1 ]
机构
[1] MIT,INSERM RES LAB,CAMBRIDGE,MA 02139
关键词
D O I
10.1109/TMTT.1978.1129395
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:379 / 379
页数:1
相关论文
共 50 条
  • [31] Evaluation of De-embedding Technique Accuracy Depending on De-embedding Patterns for CMOS Circuits up to 110 GHz
    Ono, Naoko
    Takano, Kyoya
    Motoyoshi, Mizuki
    Katayama, Kosuke
    Fujishima, Minoru
    2012 7TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC), 2012, : 548 - 551
  • [32] Self-reference photonic sampling measurement of photodiode chips with microwave de-embedding
    He, Yutong
    Ng, Chao J.
    Wang, Mengke
    Xu, Ying
    Zhang, Yali
    Zhang, Zhiyao
    Zhang, Shangjian
    Liu, Yong
    SEMICONDUCTOR LASERS AND APPLICATIONS XII, 2022, 12311
  • [33] Novel Discontinuity Modeling with Machine Learning and Application to Microwave Test Fixture De-embedding
    Tseng, Chu-Tsung
    Tsai, Poyu
    Yang, Chi-Pin
    Lu, Shihwen
    Chang, Harrison
    2021 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS), 2021, : 553 - 555
  • [34] A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs
    Wang, Yueh-Hua
    Cho, Ming-Hsiang
    Wu, Lin-Kun
    IEICE TRANSACTIONS ON ELECTRONICS, 2009, E92C (09): : 1157 - 1162
  • [35] Quantitative analysis of errors in on-wafer s-parameter de-embedding techniques for high frequency device modeling
    Groves, Rob
    Wang, Jing
    Wagner, Lawrence
    Wan, Ava
    PROCEEDINGS OF THE 2006 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, 2006, : 92 - +
  • [36] Reciprocity-based Multiport De-embedding and an Analysis of Standard Sensitivity
    Martens, J.
    72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM: TIME DOMAIN AND FREQUENCY DOMAIN MEASUREMENT, 2008, : 151 - 156
  • [37] Modeling and de-embedding the interferometric scanning microwave microscopy by means of dopant profile calibration
    Michalas, L.
    Wang, F.
    Brillard, C.
    Chevalier, N.
    Hartmann, J. M.
    Marcelli, R.
    Theron, D.
    APPLIED PHYSICS LETTERS, 2015, 107 (22)
  • [38] Comparative Analysis of On-Chip Transmission Line De-Embedding Techniques
    Amakawa, S.
    Katayama, K.
    Takano, K.
    Yoshida, T.
    Fujishima, M.
    2015 IEEE INTERNATIONAL SYMPOSIUM ON RADIO-FREQUENCY INTEGRATION TECHNOLOGY (RFIT), 2015, : 91 - 93
  • [39] DISCUSSION OF DE-EMBEDDING TECHNIQUES USING TIME-DOMAIN ANALYSIS
    STINEHELFER, HE
    PROCEEDINGS OF THE IEEE, 1986, 74 (01) : 90 - 94
  • [40] De-embedding of Lumped-Element Characteristics with the Aid of EM Analysis
    Hirano, T.
    Hirokawa, J.
    Ando, M.
    Nakano, H.
    Hirachi, Y.
    2008 IEEE ANTENNAS AND PROPAGATION SOCIETY INTERNATIONAL SYMPOSIUM, VOLS 1-9, 2008, : 3499 - +