NOISE IN LONG P-I-N GERMANIUM DIODES

被引:2
|
作者
OKAMOTO, M
LIU, ST
VANDERZI.A
机构
关键词
D O I
10.1109/T-ED.1968.16160
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:185 / &
相关论文
共 50 条
  • [1] NOISE IN P-I-N JUNCTION DIODES
    PERALA, RA
    VANDERZI.A
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1967, ED14 (03) : 172 - &
  • [2] OSCILLATIONS IN P-I-N GERMANIUM DIODES IN CROSSED FIELDS
    KAKIHANA, S
    [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (13) : 5002 - &
  • [3] Voltage Noise Characteristics of Polysilicon P-I-N Diodes
    Jamshidi-Roudbari, Abbas
    Hatalis, Miltiadis K.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011, 58 (04) : 1054 - 1062
  • [4] NOISE IN A-SI-H P-I-N DETECTOR DIODES
    CHO, GS
    QURESHI, S
    DREWERY, JS
    JING, T
    KAPLAN, SN
    LEE, H
    MIRESHGHI, A
    PEREZMENDEZ, V
    WILDERMUTH, D
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1992, 39 (04) : 641 - 644
  • [5] P-i-N and Schottky P-i-N diamond diodes for high power limiters
    Surdi, Harshad
    Bressler, Mason
    Ahmad, Mohammad Faizan
    Koeck, Franz
    Winters, Bryce
    Goodnick, Stephen
    Thornton, Trevor
    Nemanich, Robert J.
    Chang, Josephine
    [J]. APPLIED PHYSICS LETTERS, 2024, 124 (06)
  • [6] COMPARISON OF SHORT AND LONG P-I-N GERMANIUM DOUBLE-INJECTION SPACE-CHARGE LIMITED DIODES
    TSAI, TN
    VANDERZIEL, A
    [J]. PHYSICA B & C, 1975, 79 (01): : 76 - 82
  • [7] Avalanche multiplication and noise in sub-micron Si p-i-n diodes
    Tan, CH
    David, JPR
    Clark, J
    Rees, GJ
    Plimmer, SA
    Robbins, DJ
    Herbert, DC
    Carline, RT
    Leong, WY
    [J]. SILICON-BASED OPTOELECTRONICS II, 2000, 3953 : 95 - 102
  • [8] SOME OBSERVATIONS ON MICROPLASMAS IN P-I-N DIODES
    SVOBODA, V
    DAVIES, LW
    [J]. SOLID-STATE ELECTRONICS, 1971, 14 (05) : 428 - +
  • [9] DEVELOPMENT AND PROPERTIES OF MICROWAVE P-I-N DIODES
    GISSING, JG
    [J]. RADIO AND ELECTRONIC ENGINEER, 1965, 29 (05): : 293 - &
  • [10] CNT Sensor arrays with P-i-N diodes
    Charisoulis, Thomas
    Jamshidi-Roudbari, Abbas
    Choi, Nack-Bong
    Hatalis, Miltos
    Lu, Yijiang
    Li, Jing
    [J]. 2013 IEEE SENSORS, 2013, : 1275 - 1278