DEGRADATION MECHANISMS AND RELIABILITY ESTIMATIONS OF CDS-CDSE PHOTOCONDUCTIVE CELLS

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作者：
MIYAKE, T
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JAPANESE JOURNAL OF APPLIED PHYSICS | 1972年 / 11卷 / 03期
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D O I：
10.1143/JJAP.11.372
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O59 [应用物理学];
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页码：372 / &
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