ANNEALING OF LIFETIME DAMAGE IN NEUTRON-IRRADIATED SILICON

被引：1

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作者：

KAWAMOTO, H

OLDHAM, WG

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来源：

APPLIED PHYSICS LETTERS | 1970年 / 16卷 / 09期

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D O I：

10.1063/1.1653220

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：346 / +

页数：1

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