PHOTOELECTRIC ULTRAMICROSCOPIC DETECTION OF CRYSTAL DEFECTS

被引：0
|
作者：
SPRINGER, J [1 ]
机构：
[1] FISK UNIV,NASHVILLE,TN 37203
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1981年 / 26卷 / 02期
关键词：
D O I：
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：83 / 84
页数：2
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