SPECTROMETRY OF MILD GAMMA AND X-RAY RADIATION USING SEMICONDUCTOR DETECTORS

被引：0
|
作者：
BALDIN, SA
IOANNESY.LM
机构：
来源：
PRIBORY I TEKHNIKA EKSPERIMENTA | 1972年 / 01期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：7 / +
页数：1
相关论文
共 50 条
  • [1] Radiation detectors for X-ray and gamma-ray spectroscopy
    Knoll, GF
    [J]. JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY, 2000, 243 (01) : 125 - 131
  • [2] Radiation Detectors for X-Ray and Gamma-Ray Spectroscopy
    G. F. Knoll
    [J]. Journal of Radioanalytical and Nuclear Chemistry, 2000, 243 : 125 - 131
  • [3] THALLIUM BROMIDE SEMICONDUCTOR X-RAY AND GAMMA-RAY DETECTORS
    OLSCHNER, F
    SHAH, KS
    LUND, JC
    ZHANG, J
    DALEY, K
    MEDRICK, S
    SQUILLANTE, MR
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1992, 322 (03): : 504 - 508
  • [4] EXCITATION OF SEMICONDUCTOR LASERS BY X-RAY AND GAMMA RADIATION
    MOLCHANO.AG
    POPOV, YM
    [J]. SOVIET PHYSICS SOLID STATE,USSR, 1970, 11 (07): : 1580 - &
  • [5] Calibration and characterization of semiconductor X-ray detectors with synchrotron radiation
    Krumrey, M.
    Gerlach, M.
    Scholze, F.
    Ulm, G.
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2006, 568 (01): : 364 - 368
  • [6] Semiconductor detectors and X-ray imaging
    Ponpon, JP
    [J]. JOURNAL DE PHYSIQUE IV, 2002, 12 (PR6): : 323 - 339
  • [7] Microhardness study of CdZnTeSe crystals for X-ray and gamma ray radiation detectors
    Moravec, P.
    Franc, J.
    Dedic, V.
    Minarik, P.
    Elhadidy, H.
    Sima, V.
    Grill, R.
    Roy, U.
    [J]. 2019 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC), 2019,
  • [8] Semiconductor materials for x-ray detectors
    Pennicard, David
    Pirard, Benoit
    Tolbanov, Oleg
    Iniewski, Krzysztof
    [J]. MRS BULLETIN, 2017, 42 (06) : 445 - 450
  • [9] Semiconductor materials for x-ray detectors
    David Pennicard
    Benoît Pirard
    Oleg Tolbanov
    Krzysztof Iniewski
    [J]. MRS Bulletin, 2017, 42 : 445 - 450
  • [10] Measurement of Soft X-Ray Radiation using the PF-4 Plasma Focus Setup with Semiconductor X-Ray Detectors
    Eliseev, S. P.
    Nikulin, V. Ya.
    Silin, P. V.
    [J]. BULLETIN OF THE LEBEDEV PHYSICS INSTITUTE, 2009, 36 (01) : 1 - 7
12345