Semiconductor materials for x-ray detectors

被引:27
|
作者
Pennicard, David [1 ,2 ]
Pirard, Benoit [3 ]
Tolbanov, Oleg [4 ]
Iniewski, Krzysztof [5 ]
机构
[1] X Spectrum GmbH, Hamburg, Germany
[2] DESY, Hamburg, Germany
[3] Mirion Technol, Lamanon, France
[4] Tomsk State Univ, Semicond Elect Dept, Funct Elect Lab, Tomsk, Russia
[5] Redlen Technol Inc, R&D Dev Act, Saanichton, BC, Canada
关键词
GERMANIUM; GROWTH;
D O I
10.1557/mrs.2017.95
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Semiconductor x-ray detectors are widely used in experiments at synchrotron facilities. The performance of these detectors depends heavily on the semiconductor material properties. Improvements in crystal growth and device processing are key to developing "high-Z" (high atomic number) semiconductors for hard x-ray detection. Germanium is the most mature high-Z semiconductor and is widely used in x-ray detectors, but it has the drawback of needing to be cooled during operation, often to cryogenic temperatures. Compound semiconductors with wide bandgaps can be used at room temperature, but crystal defects can degrade their performance. Gallium arsenide currently shows poorer energy resolution, but its comparative robustness and stability over time make it a strong option for imaging detectors. Cadmium telluride and cadmium zinc telluride both provide higher detection efficiencies at extreme x-ray energies as well as good energy resolution; the main challenge with these materials is maintaining consistent behavior under a high x-ray flux.
引用
收藏
页码:445 / 450
页数:6
相关论文
共 50 条
  • [1] Semiconductor materials for x-ray detectors
    David Pennicard
    Benoît Pirard
    Oleg Tolbanov
    Krzysztof Iniewski
    MRS Bulletin, 2017, 42 : 445 - 450
  • [2] Semiconductor detectors and X-ray imaging
    Ponpon, JP
    JOURNAL DE PHYSIQUE IV, 2002, 12 (PR6): : 323 - 339
  • [3] EFFICIENCY CALIBRATION OF SEMICONDUCTOR X-RAY DETECTORS
    CAMPBELL, JL
    OBRIEN, P
    MCNELLES, LA
    NUCLEAR INSTRUMENTS & METHODS, 1971, 92 (02): : 269 - &
  • [5] Semiconductor X-ray detectors - Recent developments
    Ponpon, JP
    Siffert, P
    JOURNAL DE PHYSIQUE IV, 1996, 6 (C4): : 703 - 719
  • [6] X-ray interaction characteristic functions in semiconductor detectors
    Kim, Jinwoo
    Tanguay, Jesse
    Cunningham, Ian A.
    Kim, Ho Kyung
    JOURNAL OF INSTRUMENTATION, 2020, 15 (03):
  • [7] Novel semiconductor detectors for X-ray astronomy and spectroscopy
    Lutz, G
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2003, 501 (01): : 288 - 297
  • [8] A nuclear spectrum generator for semiconductor X-ray detectors
    Zeng Guo-Qiang
    Tan Cheng-Jun
    Luo Qun
    Ge Liang-Quan
    Li Chen
    Gong Chun-Hui
    Liu Xi-Yao
    NUCLEAR SCIENCE AND TECHNIQUES, 2014, 25 (03)
  • [9] EFFICIENCY CALIBRATION OF SEMICONDUCTOR DETECTORS IN X-RAY REGION
    HANSEN, JS
    MCGEORGE, JC
    FINK, RW
    NUCLEAR INSTRUMENTS & METHODS, 1973, 112 (1-2): : 239 - 241
  • [10] Spectral response of pixellated semiconductor X-ray detectors
    Frojdh, Christer
    Nilsson, Hans-Erik
    Norlin, Borje
    2005 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-5, 2005, : 2967 - 2970