FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE

被引：0
|
作者：
AIHARA, R [1 ]
SAITO, H [1 ]
KOHINATA, H [1 ]
OGURA, K [1 ]
OTSUGI, H [1 ]
机构：
[1] JEOL LTD,TOKYO,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1978年 / 27卷 / 04期
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D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：353 / 353
页数：1
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