TRANSMISSION ACOUSTIC MICROSCOPY FOR STUDY OF DEFECTS IN SOLID-STATE DEVICES

被引：0

作者：

TSAI, CS

WANG, JK

LEE, CC

机构：

[1] CARNEGIE MELLON UNIV,CTR JOINING MAT,PITTSBURGH,PA 15213

[2] CARNEGIE MELLON UNIV,DEPT ELECT ENGN,PITTSBURGH,PA 15213

来源：

IEEE TRANSACTIONS ON SONICS AND ULTRASONICS | 1980年 / 27卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

引用

页码：152 / 152

页数：1

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