TRANSMISSION ACOUSTIC MICROSCOPY FOR STUDY OF DEFECTS IN SOLID-STATE DEVICES

被引：0
|
作者：
TSAI, CS
WANG, JK
LEE, CC
机构：
[1] CARNEGIE MELLON UNIV,CTR JOINING MAT,PITTSBURGH,PA 15213
[2] CARNEGIE MELLON UNIV,DEPT ELECT ENGN,PITTSBURGH,PA 15213
来源：
IEEE TRANSACTIONS ON SONICS AND ULTRASONICS | 1980年 / 27卷 / 03期
关键词：
D O I：
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中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
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页码：152 / 152
页数：1
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