DIELECTRIC CHARACTERIZATION OF PRINTED-CIRCUIT BOARD SUBSTRATES

被引：3

作者：

RIEDELL, CH ^{[1
]}

STEER, MB ^{[1
]}

KAY, MR ^{[1
]}

KASTEN, JS ^{[1
]}

BASEL, MS ^{[1
]}

POMERLEAU, R ^{[1
]}

机构：

[1] N CAROLINA STATE UNIV,CTR COMMUNICAT & SIGNAL PROC,DEPT ELECT & COMP ENGN,RALEIGH,NC 27695

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1990年 / 39卷 / 02期

关键词：

D O I：

10.1109/19.52532

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The design and quality assurance of high-speed digital systems requires a fast and accurate method for the electrical characterization of printed circuit substrates. This paper presents a new technique for measuring the dielectric properties of such substrates based on the measured scattering parameters of a transmission line. The method is broad hand, determines the effective permittivity and loss tangent, and is compatible with existing substrate quality assurance schemes. Comparisons with alternative permittivity characterization techniques are presented. © 1990 IEEE

引用

页码：437 / 440

页数：4

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