AUTOMATED TEST SET FOR HIGH-RESOLUTION ANALOG-TO-DIGITAL AND DIGITAL-TO-ANALOG CONVERTERS

被引：11
|
作者：
SOUDERS, TM
FLACH, DR
机构：
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1979年 / 28卷 / 04期
关键词：
D O I：
10.1109/TIM.1979.4314824
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：239 / 249
页数：11
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