AUTOMATED TEST SET FOR HIGH-RESOLUTION ANALOG-TO-DIGITAL AND DIGITAL-TO-ANALOG CONVERTERS

被引：11

|

作者：

SOUDERS, TM

FLACH, DR

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1979年 / 28卷 / 04期

关键词：

D O I：

10.1109/TIM.1979.4314824

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：239 / 249

页数：11

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