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- [22] QUANTIFICATION OF ENDGROUP FUNCTIONALIZATION USING TIME-OF-FLIGHT STATIC SECONDARY-ION MASS-SPECTROMETRY ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 206 : 45 - POLY
- [25] INSTRUMENT COMBINING X-RAY PHOTOELECTRON-SPECTROSCOPY AND SECONDARY ION MASS-SPECTROMETRY FOR SURFACE STUDIES REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (11): : 1386 - 1390
- [26] X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS) AND SECONDARY ION MASS-SPECTROMETRY (SIMS) OF CATALYST SURFACES ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1980, 180 (AUG): : 102 - COLL
- [27] SURFACE CHARACTERIZATION OF POLYMERS - COMPLEMENTARY INFORMATION FROM X-RAY PHOTOELECTRON-SPECTROSCOPY AND STATIC SECONDARY ION MASS-SPECTROMETRY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 1441 - 1446