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- [6] ANALYSIS OF STOICHIOMETRY AND OXIDE-GROWTH OF HF TREATED GAAS(100) BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (01): : 147 - 153
- [7] STATIC SECONDARY-ION MASS-SPECTROMETRY AND X-RAY PHOTOELECTRON-SPECTROSCOPY FOR THE CHARACTERIZATION OF SURFACE-DEFECTS IN PAPER PRODUCTS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (04): : 2515 - 2522
- [9] COMBINED INSTRUMENT FOR THE ONLINE INVESTIGATION OF PLASMA-DEPOSITED OR ETCHED SURFACES BY MONOCHROMATIZED X-RAY PHOTOELECTRON-SPECTROSCOPY AND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (03): : 671 - 676