首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
EPITAXIAL-GROWTH FROM SIH4 IN A REDUCED PRESSURE SYSTEM
被引:0
|
作者
:
LUCARINI, VJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
LUCARINI, VJ
[
1
]
BRATTER, RL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
BRATTER, RL
[
1
]
BASSO, JE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
BASSO, JE
[
1
]
机构
:
[1]
IBM CORP,SYST PROD DIV,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1974年
/ 121卷
/ 03期
关键词
:
D O I
:
暂无
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:C91 / C91
页数:1
相关论文
共 50 条
[1]
Analytical Model for Epitaxial Growth of SiGe from SiH4 and GeH4 in Reduced-Pressure Chemical Vapor Deposition
Imai, Masato
论文数:
0
引用数:
0
h-index:
0
机构:
RIKEN, Ctr Intellectual Property Strategy, Nanofunct Mat Lab, Wako, Saitama 3510198, Japan
SUMCO TECHXIV Co Ltd, Nagasaki 8568555, Japan
RIKEN, Ctr Intellectual Property Strategy, Nanofunct Mat Lab, Wako, Saitama 3510198, Japan
Imai, Masato
Miyamura, Yoshiji
论文数:
0
引用数:
0
h-index:
0
机构:
RIKEN, Ctr Intellectual Property Strategy, Nanofunct Mat Lab, Wako, Saitama 3510198, Japan
SUMCO TECHXIV Co Ltd, Nagasaki 8568555, Japan
RIKEN, Ctr Intellectual Property Strategy, Nanofunct Mat Lab, Wako, Saitama 3510198, Japan
Miyamura, Yoshiji
Murata, Daisuke
论文数:
0
引用数:
0
h-index:
0
机构:
RIKEN, Ctr Intellectual Property Strategy, Nanofunct Mat Lab, Wako, Saitama 3510198, Japan
SUMCO TECHXIV Co Ltd, Nagasaki 8568555, Japan
RIKEN, Ctr Intellectual Property Strategy, Nanofunct Mat Lab, Wako, Saitama 3510198, Japan
Murata, Daisuke
Kanda, Takahiro
论文数:
0
引用数:
0
h-index:
0
机构:
RIKEN, Ctr Intellectual Property Strategy, Nanofunct Mat Lab, Wako, Saitama 3510198, Japan
SUMCO TECHXIV Co Ltd, Nagasaki 8568555, Japan
RIKEN, Ctr Intellectual Property Strategy, Nanofunct Mat Lab, Wako, Saitama 3510198, Japan
Kanda, Takahiro
JAPANESE JOURNAL OF APPLIED PHYSICS,
2008,
47
(12)
: 8733
-
8738
[2]
EPITAXIAL-GROWTH OF SILICON FROM SIH4 IN TEMPERATURE-RANGE 800-1150 DEGREES C
TOWNSEND, WG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLL SWANSEA,DEPT ELECT ENGN,SWANSEA,GLAMORGAN,WALES
UNIV COLL SWANSEA,DEPT ELECT ENGN,SWANSEA,GLAMORGAN,WALES
TOWNSEND, WG
UDDIN, ME
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLL SWANSEA,DEPT ELECT ENGN,SWANSEA,GLAMORGAN,WALES
UNIV COLL SWANSEA,DEPT ELECT ENGN,SWANSEA,GLAMORGAN,WALES
UDDIN, ME
SOLID-STATE ELECTRONICS,
1973,
16
(01)
: 39
-
42
[3]
SELECTIVE SILICON EPITAXIAL-GROWTH AT 800-DEGREES-C BY ULTRALOW-PRESSURE CHEMICAL VAPOR-DEPOSITION USING SIH4 AND SIH4/H2
YEW, TR
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
YEW, TR
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
REIF, R
JOURNAL OF APPLIED PHYSICS,
1989,
65
(06)
: 2500
-
2507
[4]
KINETICS AND MECHANISMS OF SURFACE-REACTIONS IN EPITAXIAL-GROWTH OF SI FROM SIH4 AND SI2H6
GATES, SM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
GATES, SM
JOURNAL OF CRYSTAL GROWTH,
1992,
120
(1-4)
: 269
-
274
[5]
EPITAXIAL-GROWTH OF BETA-SIC ON SI BY RTCVD WITH C3H8 AND SIH4
STECKL, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
Nanoelectronics Laboratory, University of Cincinnati, Cincinnati, OH
STECKL, AJ
LI, JP
论文数:
0
引用数:
0
h-index:
0
机构:
Nanoelectronics Laboratory, University of Cincinnati, Cincinnati, OH
LI, JP
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1992,
39
(01)
: 64
-
74
[6]
EPITAXIAL-GROWTH OF SI-GE LAYERS ON SI SUBSTRATES BY PLASMA DISSOCIATION OF SIH4 AND GEH4 MIXTURE
SUZUKI, S
论文数:
0
引用数:
0
h-index:
0
SUZUKI, S
ITOH, T
论文数:
0
引用数:
0
h-index:
0
ITOH, T
JOURNAL OF APPLIED PHYSICS,
1983,
54
(11)
: 6385
-
6389
[7]
LOW-TEMPERATURE SILICON EPITAXIAL-GROWTH BY CO2-LASER CVD USING SIH4 GAS
MEGURO, T
论文数:
0
引用数:
0
h-index:
0
机构:
RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN
RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN
MEGURO, T
ISHIHARA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN
RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN
ISHIHARA, Y
ITOH, T
论文数:
0
引用数:
0
h-index:
0
机构:
RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN
RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN
ITOH, T
TASHIRO, H
论文数:
0
引用数:
0
h-index:
0
机构:
RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN
RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN
TASHIRO, H
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
1986,
25
(04):
: 524
-
527
[8]
Surface imperfection behavior during the SiH4 epitaxial growth process
Imai, M
论文数:
0
引用数:
0
h-index:
0
机构:
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Imai, M
Inoue, K
论文数:
0
引用数:
0
h-index:
0
机构:
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Inoue, K
Mayusumi, M
论文数:
0
引用数:
0
h-index:
0
机构:
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Mayusumi, M
Gima, S
论文数:
0
引用数:
0
h-index:
0
机构:
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Gima, S
Nakahara, S
论文数:
0
引用数:
0
h-index:
0
机构:
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Super Silicon Crystal Res Inst Corp, Gunma 3790125, Japan
Nakahara, S
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
2000,
147
(04)
: 1568
-
1572
[9]
EPITAXIAL DEPOSITION OF SILICON BY PYROLYSIS OF SIH4
NISHI, Y
论文数:
0
引用数:
0
h-index:
0
NISHI, Y
WATANABE, M
论文数:
0
引用数:
0
h-index:
0
WATANABE, M
JAPANESE JOURNAL OF APPLIED PHYSICS,
1967,
6
(04)
: 550
-
+
[10]
SILICON SELECTIVE EPITAXIAL-GROWTH AT REDUCED PRESSURE AND TEMPERATURE
REGOLINI, JL
论文数:
0
引用数:
0
h-index:
0
机构:
CNRS,ETUD PROPRIETES ELECTR SOLIDES LAB,F-38042 GRENOBLE,FRANCE
REGOLINI, JL
BENSAHEL, D
论文数:
0
引用数:
0
h-index:
0
机构:
CNRS,ETUD PROPRIETES ELECTR SOLIDES LAB,F-38042 GRENOBLE,FRANCE
BENSAHEL, D
MERCIER, J
论文数:
0
引用数:
0
h-index:
0
机构:
CNRS,ETUD PROPRIETES ELECTR SOLIDES LAB,F-38042 GRENOBLE,FRANCE
MERCIER, J
SCHEID, E
论文数:
0
引用数:
0
h-index:
0
机构:
CNRS,ETUD PROPRIETES ELECTR SOLIDES LAB,F-38042 GRENOBLE,FRANCE
SCHEID, E
JOURNAL OF CRYSTAL GROWTH,
1989,
96
(03)
: 505
-
512
←
1
2
3
4
5
→