MICROPROCESSOR-CONTROLLED SLIT SYSTEM FOR MEASURING BEAM EMITTANCE

被引：0
|
作者：
BURT, W [1 ]
GENTILE, T [1 ]
NOE, JW [1 ]
PAUL, P [1 ]
SPROUSE, GD [1 ]
机构：
[1] SUNY STONY BROOK,STONY BROOK,NY 11790
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1978年 / 23卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：541 / 541
页数：1
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