MICROPROCESSOR-CONTROLLED SLIT SYSTEM FOR MEASURING BEAM EMITTANCE

被引：0

作者：

BURT, W ^{[1
]}

GENTILE, T ^{[1
]}

NOE, JW ^{[1
]}

PAUL, P ^{[1
]}

SPROUSE, GD ^{[1
]}

机构：

[1] SUNY STONY BROOK,STONY BROOK,NY 11790

来源：

BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1978年 / 23卷 / 04期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：541 / 541

页数：1

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