OPTICAL-PROPERTIES OF EPITAXIAL COSI2 AND NISI2 FILMS ON SILICON

被引:29
|
作者
JIMENEZ, JR
WU, ZC
SCHOWALTER, LJ
HUNT, BD
FATHAUER, RW
GRUNTHANER, PJ
LIN, TL
机构
[1] RENSSELAER POLYTECH INST,CTR INTEGRATED ELECTR,TROY,NY 12180
[2] GE,CTR CORP RES & DEV,SCHENECTADY,NY 12301
[3] CALTECH,JET PROP LAB,PASADENA,CA 91109
关键词
D O I
10.1063/1.344217
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2738 / 2741
页数:4
相关论文
共 50 条
  • [21] Electronic structure of a buried NiSi2 or CoSi2 layer in bulk Si
    Schick, J. T.
    Bose, S. M.
    Physical Review B: Condensed Matter, 53 (19):
  • [22] Electronic structure of a buried NiSi2 or CoSi2 layer in bulk Si
    Schick, JT
    Bose, SM
    PHYSICAL REVIEW B, 1996, 53 (19): : 12609 - 12612
  • [23] Vacancy formation in CoSi2 and NiSi2 from ab initio calculation
    Wang, T
    Dai, YB
    Ouyang, SK
    Wang, QK
    Shen, HS
    Wu, JS
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2004, 18 (23-24): : 3185 - 3193
  • [24] Homogeneous Nucleation of Epitaxial CoSi2 and NiSi in Si Nanowires
    Chou, Yi-Chia
    Wu, Wen-Wei
    Chen, Lih-Juann
    Tu, King-Ning
    NANO LETTERS, 2009, 9 (06) : 2337 - 2342
  • [25] NEAR-INFRARED OPTICAL-PROPERTIES OF COSI2 THIN-FILMS
    DUBOZ, JY
    BADOZ, PA
    HENZ, J
    VONKANEL, H
    JOURNAL OF APPLIED PHYSICS, 1990, 68 (05) : 2346 - 2350
  • [26] X-RAY-ABSORPTION SPECTROSCOPY IN COSI2 AND NISI2 - EXPERIMENT AND THEORY
    LERCH, P
    JARLBORG, T
    CODAZZI, V
    LOUPIAS, G
    FLANK, AM
    PHYSICAL REVIEW B, 1992, 45 (20): : 11481 - 11490
  • [27] EPITAXIAL NISI2 FILMS ON SI(100)
    TEICHERT, S
    BRETSCHNEIDER, W
    HELMS, H
    BEDDIES, G
    FRANKE, T
    LANGE, C
    THIN SOLID FILMS, 1993, 229 (02) : 137 - 139
  • [28] MEASUREMENTS ON THE ELECTRICAL TRANSPORT-PROPERTIES IN COSI2 AND NISI2 FORMED BY THIN-FILM REACTIONS
    KRONTIRAS, C
    SALMI, J
    GRONBERG, L
    SUNI, I
    HELESKIVI, J
    RISSANEN, A
    THIN SOLID FILMS, 1985, 125 (1-2) : 93 - 99
  • [29] STUDY OF EPITAXIAL NISI2 ON SILICON BY TRANSMISSION CHANNELING
    CHEUNG, N
    NICOLET, MA
    MAYER, JW
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (08) : C344 - C344
  • [30] SCHOTTKY BARRIERS CALCULATIONS AT THE COSI2/SI(111) AND NISI2/SI(111) INTERFACES
    MAGAUDMARTINAGE, L
    MAYOU, D
    PASTUREL, A
    CYROTLACKMANN, F
    SURFACE SCIENCE, 1991, 256 (03) : 379 - 384