AUTOMATED TEST-GENERATION FOR INTEGRATED-CIRCUITS

被引：0

作者：

MARLETT, R

机构：

来源：

VLSI SYSTEMS DESIGN | 1986年 / 7卷 / 07期

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D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：68 / &

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