X-RAY SINGLE STRUCTURAL-ANALYSIS OF 4 CEPHEM DERIVATIVES

被引：0
|
作者：
KOBELT, D [1 ]
PAULUS, EF [1 ]
机构：
[1] FARBWERKE HOECHST AG,FRANKFURT,WEST GERMANY
来源：
ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 1973年 / 137卷 / 5-6期
关键词：
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：453 / 454
页数：2
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