Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns

被引：582

|

作者：

Hanawalt, JD ^{[1
]}

Rinn, HW ^{[1
]}

Frevel, LK ^{[1
]}

机构：

[1] Dow Chem Co, Midland, MI USA

来源：

INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION | 1938年 / 10卷

关键词：

D O I：

10.1021/ac50125a001

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

收藏

页码：0457 / 0512

页数：56

相关论文

共 50 条

[31] Chemical and Structural Analysis of Rocks Using X-ray Fluorescence and X-ray Diffraction Techniques
Sabri, Mohammed M.
ARO-THE SCIENTIFIC JOURNAL OF KOYA UNIVERSITY, 2020, 8 (01): : 79 - 87
[32] Use of polycapillary X-ray lenses in the X-ray diffraction measurement of texture
Welzel, U
Leoni, M
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2002, 35 : 196 - 206
[33] CONFERENCE ON X-RAY DIFFRACTION ANALYSIS
不详
NATURE, 1945, 155 (3932) : 299 - 299
[34] X-RAY DIFFRACTION BROADENING ANALYSIS
Popovic, Stanko
Skoko, Zeljko
MACEDONIAN JOURNAL OF CHEMISTRY AND CHEMICAL ENGINEERING, 2015, 34 (01) : 39 - 49
[35] QUANTITATIVE X-RAY DIFFRACTION ANALYSIS
COPELAND, LE
BRAGG, RH
ANALYTICAL CHEMISTRY, 1958, 30 (02) : 196 - 201
[36] X-RAY DIFFRACTION ANALYSIS.
Dubrawski, Jules V.
1600, (26):
[37] TABLES FOR X-RAY DIFFRACTION ANALYSIS
不详
ACTA CRYSTALLOGRAPHICA, 1949, 2 (02): : 131 - 131
[38] Stress analysis by X-ray diffraction
Barrett, C. S.
Gensamer, M.
PHYSICS-A JOURNAL OF GENERAL AND APPLIED PHYSICS, 1936, 7 (01): : 1 - 8
[39] A GONIOMETER FOR X-RAY DIFFRACTION ANALYSIS
NARASIMHAN, AV
INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1967, 5 (07) : 311 - +
[40] Strain analysis by X-ray diffraction
Fewster, PF
Andrew, NL
THIN SOLID FILMS, 1998, 319 (1-2) : 1 - 8

← 1 2 3 4 5 →