IMAGE CONTRASTS IN INSULATING FILMS OBSERVED BY SHADOW ELECTRON MICROSCOPY

被引:0
|
作者
DOVE, DB
机构
关键词
D O I
暂无
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2526 / &
相关论文
共 50 条
  • [31] CONTRASTS OF MAGNETIC-PROPERTIES IN FE-SI, OBSERVED IN SCANNING MICROSCOPY
    GERVAIS, A
    PHILIBERT, J
    RIVIERE, A
    TIXIER, R
    REVUE DE PHYSIQUE APPLIQUEE, 1974, 9 (02): : 433 - 441
  • [32] STUDY ON CONTRASTS IN ELECTRON-MICROSCOPY BY MONOCRYSTALS OF VARIABLE THICKNESS
    PARDO, B
    RENARD, D
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 35 (01): : 329 - 338
  • [33] VISIBLY BETTER EDGE-DETECTION USING OBSERVED IMAGE CONTRASTS
    KAUSHAL, TP
    PATTERN RECOGNITION LETTERS, 1994, 15 (07) : 641 - 647
  • [34] INFLUENCE OF INELASTIC DIFFUSION ON FORMATION OF DIFFRACTION CONTRASTS IN ELECTRON MICROSCOPY
    ELHILI, A
    JOURNAL DE MICROSCOPIE, 1967, 6 (06): : 693 - +
  • [35] Photoinduced scanning tunneling microscopy of insulating diamond films
    Mercer, T.W., 1600, (American Inst of Physics, Woodbury, NY, United States):
  • [36] CHARGING OF BULK SPECIMENS, INSULATING LAYERS AND FREE-SUPPORTING FILMS IN SCANNING ELECTRON-MICROSCOPY
    REIMER, L
    GOLLA, U
    BONGELER, R
    KASSENS, M
    SCHINDLER, B
    SENKEL, R
    OPTIK, 1992, 92 (01): : 14 - 22
  • [37] ELECTRON TRANSPORT MECHANISMS IN THIN INSULATING FILMS
    MEAD, CA
    PHYSICAL REVIEW, 1962, 128 (05): : 2088 - &
  • [38] ELECTRON TUNNELING THROUGH THIN INSULATING FILMS
    CRUZ, EL
    HELMAN, JS
    PHYSICAL REVIEW B, 1974, 10 (04): : 1751 - 1754
  • [39] Hydrogen Absorption of Palladium Thin Films Observed by in Situ Transmission Electron Microscopy with an Environmental Cell
    Zhang, Tengfei
    Nakagawa, Yuki
    Wakasugi, Takenobu
    Isobe, Shigehito
    Wang, Yongming
    Hashimoto, Naoyuki
    Ohnuki, Somei
    ACS APPLIED MATERIALS & INTERFACES, 2016, 8 (23) : 14548 - 14551
  • [40] Morphology of threading dislocations in high-resistivity GaN films observed by transmission electron microscopy
    Lu, L.
    Shen, B.
    Xu, F. J.
    Xu, J.
    Gao, B.
    Yang, Z. J.
    Zhang, G. Y.
    Zhang, G. Y.
    Zhang, X. P.
    Xu, J.
    Yu, D. P.
    JOURNAL OF APPLIED PHYSICS, 2007, 102 (03)