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- [2] From the physics of secondary electron emission to image contrasts in scanning electron microscopyMicrosc., 5 (261-284):Laboratoire d’Ingénierie et Sciences des Matériaux , Faculty of Sciences, EA 4695, BP 1039, Reims51687 Cedex 2, France
- [3] From the physics of secondary electron emission to image contrasts in scanning electron microscopyJOURNAL OF ELECTRON MICROSCOPY, 2012, 61 (05): : 261 - 284Cazaux, Jacques
- [4] TWINNING IN PERMALLOY FILMS AS OBSERVED BY ELECTRON DIFFRACTION AND ELECTRON MICROSCOPYJOURNAL OF APPLIED PHYSICS, 1962, 33 (04) : 1442 - &SCHONING, FRLBALTZ, A
- [5] PROTECTIVE FILMS ON MAGNESIUM OBSERVED BY ELECTRON DIFFRACTION AND MICROSCOPYJOURNAL OF APPLIED PHYSICS, 1954, 25 (11) : 1437 - 1438YAMAGUCHI, S
- [6] DOMAINS IN THIN MAGNETIC FILMS OBSERVED BY ELECTRON MICROSCOPYJOURNAL OF APPLIED PHYSICS, 1960, 31 (10) : 1699 - 1705FULLER, HWHALE, ME
- [7] OBSERVATION WITH SCANNING ELECTRON-MICROSCOPY ON CONTRASTS DUE TO SURFACE POTENTIAL VARIATION ON INSULATING FERROELECTRIC CRYSTALSJOURNAL DE MICROSCOPIE, 1972, 14 (02): : A8 - +LEBIHAN, RMAUSSION, M
- [8] Maximizing the Electron Microscopy Contrasts for AnalysisISTFA 2017: CONFERENCE PROCEEDINGS FROM THE 43RD INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2017, : 345 - 348Toh, Suey LiJi, Rong
- [9] OBSERVATION OF LATTICE-CONSERVATING TWINS BY ELECTRON-MICROSCOPY - STUDY OF IMAGE CONTRASTSPHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 34 (01): : 331 - 338NIHOULBOUTANG, GBOULESTEIX, C