SMALL MAGNETIC PATTERNS WRITTEN WITH - A SCANNING TUNNELING MICROSCOPE

被引：5

作者：

WATANUKI, O

SONOBE, Y

TSUJI, S

SAI, F

机构：

[1] IBM JAPAN LTD,SITE TECH OPERAT,APPLICAT TECHNOL,FUJISAWA 252,JAPAN

[2] IBM JAPAN LTD,IBM RES,TOKYO RES LAB,FUJISAWA 252,JAPAN

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1991年 / 27卷 / 06期

关键词：

D O I：

10.1109/20.278815

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a technique for writing submicron magnetic bit patterns on double-layered perpendicular recording media by using a Scanning Tunneling Microscope (STM) with an amorphous magnetic tip and observing them with a Magnetic Force Microscope (MFM). The proposed technique provides a very small tip-to-medium spacing on the order of Angstroms.

引用

页码：5289 / 5291

页数：3

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