SMALL MAGNETIC PATTERNS WRITTEN WITH - A SCANNING TUNNELING MICROSCOPE

被引：5
|
作者：
WATANUKI, O
SONOBE, Y
TSUJI, S
SAI, F
机构：
[1] IBM JAPAN LTD,SITE TECH OPERAT,APPLICAT TECHNOL,FUJISAWA 252,JAPAN
[2] IBM JAPAN LTD,IBM RES,TOKYO RES LAB,FUJISAWA 252,JAPAN
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1991年 / 27卷 / 06期
关键词：
D O I：
10.1109/20.278815
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a technique for writing submicron magnetic bit patterns on double-layered perpendicular recording media by using a Scanning Tunneling Microscope (STM) with an amorphous magnetic tip and observing them with a Magnetic Force Microscope (MFM). The proposed technique provides a very small tip-to-medium spacing on the order of Angstroms.
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页码：5289 / 5291
页数：3
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