X-RAY TOPOGRAPHIC MAPPING OF LATTICE DEFECTS IN MONOCRYSTALS OF 2 AMMONIUM OXALATES

被引：0

作者：

KLAPPER, H

KUPPERS, H

机构：

来源：

ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE | 1972年 / 135卷 / 5-6期

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中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：468 / &

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[1] CHAMBER FOR X-RAY TOPOGRAPHIC STUDY OF MONOCRYSTALS
BARANOV, YV
KOSTYUKOVA, EP
PRIBORY I TEKHNIKA EKSPERIMENTA, 1975, (04): : 205 - 207
[2] X-RAY TOPOGRAPHIC OBSERVATION OF LATTICE DEFECTS IN TGS CRYSTALS
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CZECHOSLOVAK JOURNAL OF PHYSICS, 1973, B 23 (03) : 331 - +
[3] USE OF X-RAY TOPOGRAPHIC METHODS FOR STUDY OF LATTICE-DEFECTS
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VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1978, 33 (190): : 9 - 14
[4] X-RAY INDUCED DEFECTS ON RBI MONOCRYSTALS
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STAUDE, H
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[5] X-RAY TOPOGRAPHIC STUDIES ON LATTICE-DEFECTS IN MNF2 (RUTILE STRUCTURE)
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[6] X-RAY TOPOGRAPHIC STUDY ON SALOL MONOCRYSTALS OBTAINED BY EVAPORATION
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[7] 7X-RAY TOPOGRAPHIC STUDIES ON LATTICE INTERFERENCE IN BENZIL MONOCRYSTALS
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JOURNAL OF CRYSTAL GROWTH, 1971, 10 (01) : 13 - &
[8] STUDIES WITH X-RAY TOPOGRAPHY ON LATTICE DISTORTION IN BENZYL MONOCRYSTALS
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ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1970, 132 (4-6): : 431 - &
[9] CORRELATION OF X-RAY TOPOGRAPHIC AND CATHODOLUMINESCENCE TOPOGRAPHIC STUDIES OF DEFECTS IN DIAMONDS
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[10] X-RAY TOPOGRAPHIC STUDY OF DEFECTS IN ANNEALED SILICON
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