CORRELATION OF X-RAY TOPOGRAPHIC AND CATHODOLUMINESCENCE TOPOGRAPHIC STUDIES OF DEFECTS IN DIAMONDS

被引：0

作者：

KIFLAWI, I ^{[1
]}

LANG, AR ^{[1
]}

机构：

[1] UNIV BRISTOL,HH WILLS PHYS LAB,BRISTOL BS8 1TL,ENGLAND

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1975年 / 31卷

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：S258 / S258

页数：1

共 50 条

[1] CATHODOLUMINESCENCE, OPTICAL-ABSORPTION AND X-RAY TOPOGRAPHIC STUDIES OF SYNTHETIC DIAMONDS
WOODS, GS
LANG, AR
[J]. JOURNAL OF CRYSTAL GROWTH, 1975, 28 (02) : 215 - 226
[2] X-RAY TOPOGRAPHIC AND OPTICAL IMAGING STUDIES OF SYNTHETIC DIAMONDS
LANG, AR
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1994, 27 : 988 - 1001
[3] X-RAY TOPOGRAPHIC STUDY OF YAKUTIAN DIAMONDS
MICHSKOV, VF
ORLOV, YL
[J]. DOKLADY AKADEMII NAUK SSSR, 1966, 166 (01): : 198 - &
[4] X-RAY TOPOGRAPHIC STUDIES OF AS-GROWN DEFECTS IN NATURAL MUSCOVITE
CORNY, F
BARONNET, A
JOURDAN, C
[J]. JOURNAL OF CRYSTAL GROWTH, 1976, 34 (02) : 304 - 315
[5] X-RAY TOPOGRAPHIC STUDIES OF DEFECTS IN SILICON DURING THERMAL OXIDATION
TONCHEVA, LT
VASSILEV, IS
[J]. DOKLADI NA BOLGARSKATA AKADEMIYA NA NAUKITE, 1974, 27 (08): : 1045 - 1048
[6] X-RAY TOPOGRAPHIC STUDIES OF DEFECTS IN SILICON INTRODUCED BY THERMAL OXIDATION
SUGITA, Y
TOKUYAMA, T
KISHINO, S
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (08) : C216 - &
[7] X-RAY TOPOGRAPHIC DEFECTS CONTRAST ON SYNTHETIC QUARTZ
CHIRILA, R
CSIKI, Z
[J]. CRYSTAL RESEARCH AND TECHNOLOGY, 1993, 28 (05) : 615 - 621
[8] X-RAY TOPOGRAPHIC STUDY OF DEFECTS IN OLIVINE CRYSTALS
SLIND, TJ
SORUM, H
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1976, 9 (FEB1) : 39 - 41
[9] X-RAY TOPOGRAPHIC STUDY OF DEFECTS IN ANNEALED SILICON
GRONKOWSKI, J
LEFELDSOSNOWSKA, M
ZIELINSKAROHOZINSKA, E
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1993, 26 (4A) : A62 - A64
[10] X-RAY TOPOGRAPHIC STUDIES OF CADMIUM SELENIDE
TAJABOR, N
LOVETT, DR
[J]. JOURNAL OF MATERIALS SCIENCE, 1977, 12 (10) : 2081 - 2086

← 1 2 3 4 5 →