SILICON SEMICONDUCTOR-DETECTORS IN PROBLEMS OF RADIOMETRIC INSPECTION

被引：0
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作者：
VALEVICH, MI
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来源：
SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR | 1979年 / 15卷 / 05期
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T [工业技术];
学科分类号：
08 ;
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页码：452 / 454
页数：3
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