INVESTIGATION OF ANODIC OXIDE LAYERS OF ALUMINIUM BY TRACER METHOD

被引:0
|
作者
RAUB, E
NITSCHE, D
KAWASE, H
WEISS, H
机构
来源
METALL | 1969年 / 23卷 / 07期
关键词
D O I
暂无
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
引用
收藏
页码:667 / &
相关论文
共 50 条
  • [31] GALVANOLUMINESCENCE OF THE ANODIC OXIDE FILM ON ALUMINIUM IN DIETHYLPHTHALATE
    EIDELBERG, MI
    OPTIKA I SPEKTROSKOPIYA, 1964, 17 (02): : 244 - 249
  • [32] Tracer studies of anodic films formed on aluminium in malonic and oxalic acids
    Garcia-Vergara, S. J.
    Skeldon, P.
    Thompson, G. E.
    Habakaki, H.
    APPLIED SURFACE SCIENCE, 2007, 254 (05) : 1534 - 1542
  • [33] A tracer investigation of chromic acid anodizing of aluminium
    Garcia-Vergara, S. J.
    Skeldon, P.
    Thompson, G. E.
    Habazaki, H.
    SURFACE AND INTERFACE ANALYSIS, 2007, 39 (11) : 860 - 864
  • [34] Investigation of anodic layer on recycled aluminium alloy
    Gadgil, VJ
    Bosch, AJ
    Keim, EG
    Pennings, JH
    Spoelstra, MB
    EUROMAT 97 - PROCEEDINGS OF THE 5TH EUROPEAN CONFERENCE ON ADVANCED MATERIALS AND PROCESSES AND APPLICATIONS: MATERIALS, FUNCTIONALITY & DESIGN, VOL 3: SURFACE ENGINEERING AND FUNCTIONAL MATERIALS, 1997, : 385 - 388
  • [35] Structural engineering of nanoporous anodic aluminium oxide by pulse anodization of aluminium
    Lee, Woo
    Schwirn, Kathrin
    Steinhart, Martin
    Pippel, Eckhard
    Scholz, Roland
    Goesele, Ulrich
    NATURE NANOTECHNOLOGY, 2008, 3 (04) : 234 - 239
  • [36] Structural engineering of nanoporous anodic aluminium oxide by pulse anodization of aluminium
    Woo Lee
    Kathrin Schwirn
    Martin Steinhart
    Eckhard Pippel
    Roland Scholz
    Ulrich Gösele
    Nature Nanotechnology, 2008, 3 : 234 - 239
  • [37] DETERMINATION OF THE REFRACTIVE INDEX OF POROUS ANODIC OXIDE FILMS ON ALUMINIUM BY A PHOTOLUMINESCENCE METHOD.
    Zekovic, L.D.
    Urosevic, V.V.
    Jovanic, B.R.
    1600, (139):
  • [38] THE PHOTOELECTROCHEMISTRY OF THIN PASSIVE LAYERS - INVESTIGATION OF ANODIC OXIDE-FILMS ON TITANIUM METAL
    DIQUARTO, F
    PIAZZA, S
    SUNSERI, C
    ELECTROCHIMICA ACTA, 1993, 38 (01) : 29 - 35
  • [39] Investigation of the relationship between the reflectance and the deposited nickel and tin amount on the aluminium anodic oxide film
    Kallithrakas-Kontos, N
    Moshohoritou, R
    Ninni, V
    Tsangaraki-Kaplangolou, I
    THIN SOLID FILMS, 1998, 326 (1-2) : 166 - 170
  • [40] Impedance characteristics of oxide layers on aluminium
    Oh, HJ
    Jang, KW
    Chi, CS
    BULLETIN OF THE KOREAN CHEMICAL SOCIETY, 1999, 20 (11) : 1340 - 1344