DETERMINATION OF TRUE INTENSITY AND POSITION OF X-RAY LINES IN X-RAY DIFFRACTION DIAGRAMS (EXCHANGE OF EXPERIENCE)

被引：0
|
作者：
BAIKOV, AM
LANDA, VA
机构：
来源：
INDUSTRIAL LABORATORY | 1968年 / 34卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1322 / &
相关论文
共 50 条
  • [41] Determination of nanoparticle sizes by X-ray diffraction
    Dorofeev, G. A.
    Streletskii, A. N.
    Povstugar, I. V.
    Protasov, A. V.
    Elsukov, E. P.
    COLLOID JOURNAL, 2012, 74 (06) : 675 - 685
  • [42] Determination of X-ray pulse duration via intensity correlation measurements of X-ray fluorescence
    Inoue, Ichiro
    Tamasaku, Kenji
    Osaka, Taito
    Inubushi, Yuichi
    Yabashi, Makina
    JOURNAL OF SYNCHROTRON RADIATION, 2019, 26 : 2050 - 2054
  • [43] DEPENDENCE OF GEOMETRY OF FORMATION OF X-RAY DIFFRACTION LINES ON INSTRUMENTAL FACTORS IN X-RAY INVESTIGATIONS OF POLYCRYSTALS
    DAVYDOV, GV
    PHYSICA STATUS SOLIDI, 1966, 18 (01): : 41 - &
  • [44] INTENSITY OF IRON X-RAY DIFFRACTION LINES AFTER PLASTIC DEFORMATION AND ANNEALING
    VOROBYEV, GM
    LYUCHKOV, AD
    PHYSICS OF METALS AND METALLOGRAPHY-USSR, 1967, 24 (03): : 93 - &
  • [45] APPLICATION OF TRUNCATED INTEGRATED INTENSITY TO ANALYSIS OF BROADENED X-RAY DIFFRACTION LINES
    CHEARY, RW
    GRIMES, NW
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1972, 5 (APR1) : 57 - &
  • [46] ON SHRINKAGE OF X-RAY FILM (EXCHANGE OF EXPERIENCE)
    BOCHKAEV, FI
    INDUSTRIAL LABORATORY, 1965, 31 (05): : 730 - &
  • [47] MICROTHERMOSTAT FOR X-RAY APPARATUS (EXCHANGE OF EXPERIENCE)
    BATALIN, GI
    SHILOV, VV
    INDUSTRIAL LABORATORY, 1968, 34 (08): : 1232 - &
  • [48] Elimination of X-Ray Diffraction through Stimulated X-Ray Transmission
    Wu, B.
    Wang, T.
    Graves, C. E.
    Zhu, D.
    Schlotter, W. F.
    Turner, J. J.
    Hellwig, O.
    Chen, Z.
    Duerr, H. A.
    Scherz, A.
    Stohr, J.
    PHYSICAL REVIEW LETTERS, 2016, 117 (02)
  • [49] Time resolved x-ray diffraction with subpicosecond x-ray pulses
    Uschmann, I
    Förster, E
    Gibbon, P
    Reich, C
    Feurer, T
    Morak, A
    Sauerbrey, R
    Rousse, A
    Audebert, P
    Geindre, JP
    Gauthier, JC
    X-RAY FEL OPTICS AND INSTRUMENTATION, 2001, 4143 : 38 - 47
  • [50] Anomalous X-ray diffraction with soft X-ray synchrotron radiation
    Carpentier, P
    Berthet-Colominas, C
    Capitan, M
    Chesne, ML
    Fanchon, E
    Lequien, S
    Stuhrmann, H
    Thiaudière, D
    Vicat, J
    Zielinski, P
    Kahn, R
    CELLULAR AND MOLECULAR BIOLOGY, 2000, 46 (05) : 915 - 935
12345