INFLUENCE OF COATINGS ON IMAGE BRIGHTNESS AND CONTRASTS IN STRUCTURAL STUDIES IN PHOTOEMISSION ELECTRON-MICROSCOPE

被引:2
|
作者
SCHUR, K [1 ]
SCHMIDT, PF [1 ]
PFEFFERKORN, G [1 ]
机构
[1] UNIV MUNSTER, INST MED PHYS, MUNSTER, WEST GERMANY
关键词
D O I
10.1007/BF00599432
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:199 / 200
页数:2
相关论文
共 50 条
  • [31] CRYSTALLOGRAPHIC STUDIES IN THE SCANNING ELECTRON-MICROSCOPE
    VOITEKHOVA, EA
    NOVIKOV, II
    OLIKHEIKO, MS
    INDUSTRIAL LABORATORY, 1978, 44 (06): : 794 - 799
  • [32] ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS
    COWLEY, JM
    IIJMA, S
    ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03): : 445 - +
  • [33] QUALITY OF ELECTRON-MICROSCOPE IMAGE BY DEFOCUSING CHANGE
    VYAZIGIN, AA
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1974, 38 (07): : 1379 - 1381
  • [34] IMAGE REVERSAL PROCESS FOR ELECTRON-MICROSCOPE FILM
    BRANDT, CR
    DAVIS, R
    JOURNAL OF MICROSCOPY, 1978, 113 (JUL) : 145 - 147
  • [35] INSTRUMENTAL ASPECTS OF IMAGE ANALYSIS IN ELECTRON-MICROSCOPE
    MULVEY, T
    JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (AUG): : 232 - 250
  • [36] TOWARDS A DIGITAL MODEL FOR AN ELECTRON-MICROSCOPE IMAGE
    BURGE, RE
    ALI, SM
    SCANNING MICROSCOPY, 1988, : 191 - 212
  • [38] CHARACTERIZATION OF AN IMAGE CONVERTER FOR ELECTRON-MICROSCOPE - ELECTROTITUS
    BEORCHIA, A
    BONHOMME, P
    BONNET, N
    LABERRIGUE, A
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1979, 4 (03): : A8 - A8
  • [39] IMAGE LUMINANCE AMPLIFIER FOR TRANSMISSION ELECTRON-MICROSCOPE
    STOYANOV, PA
    KUPRIYANOVA, TG
    MOSEEV, VV
    NELIN, VV
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1990, 57 (02): : 88 - 90
  • [40] USE OF SCANNING ELECTRON-MICROSCOPE FOR ANALYSIS OF COATINGS SYSTEMS
    PROVDER, T
    HOLSWORTH, RM
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1976, 172 (SEP3): : 28 - 28