MEASUREMENT OF MINORITY CARRIER DIFFUSION LENGTH AND LIFETIME BY MEANS OF THE PHOTOVOLTAIC EFFECT

被引:0
|
作者
WALDNER, M
机构
来源
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1004 / 1005
页数:2
相关论文
共 50 条
  • [21] SELF-CONSISTENT MODEL OF MINORITY-CARRIER LIFETIME, DIFFUSION LENGTH, AND MOBILITY
    LAW, ME
    SOLLEY, E
    LIANG, M
    BURK, DE
    IEEE ELECTRON DEVICE LETTERS, 1991, 12 (08) : 401 - 403
  • [22] MINORITY-CARRIER LIFETIME MEASUREMENT IN GAAS
    PENCE, IW
    GREILING, PT
    PROCEEDINGS OF THE IEEE, 1974, 62 (07) : 1030 - 1031
  • [23] SINGLE PROBE MEASUREMENT OF MINORITY CARRIER LIFETIME
    TYAGI, RC
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1970, 15 (11): : 1341 - +
  • [24] Minority Carrier Lifetime Measurement of Solar Cell
    Ranjan, Vikash
    Solanki, Chetan S.
    Lal, R. K.
    2ND NATIONAL WORKSHOP ON ADVANCED OPTOELECTRONIC MATERIALS AND DEVICES (AOMD-2008), 2008, : 299 - +
  • [25] Contactless measurement of minority carrier lifetime in silicon
    Babu, S
    Subramanian, V
    Rao, YS
    Sobhanadri, J
    SEMICONDUCTOR DEVICES, 1996, 2733 : 304 - 306
  • [26] APPARATUS FOR MEASUREMENT OF MINORITY-CARRIER LIFETIME
    PANOV, AY
    SAMOKHVALOV, MK
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1986, 29 (06) : 1442 - 1444
  • [27] MEASUREMENT OF MINORITY-CARRIER DIFFUSION LENGTH IN SEMICONDUCTORS USING A COMPUTERIZED FACILITY
    GERMANOVA, K
    NIKOLOV, L
    KHARDALOV, C
    TSVETKOV, T
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1994, 37 (02) : 224 - 227
  • [28] MEASUREMENT OF MINORITY-CARRIER DIFFUSION LENGTH IN POLYCRYSTALLINE SOLAR-CELLS
    SOPORI, BL
    LEGGE, RN
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : C111 - C111
  • [29] MEASUREMENT OF THE MINORITY-CARRIER DIFFUSION LENGTH IN THIN SEMICONDUCTOR-FILMS
    CHIANG, CL
    SCHWARZ, R
    SLOBODIN, DE
    KOLODZEY, J
    WAGNER, S
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (10) : 1587 - 1592
  • [30] Measurement of the steady-state minority carrier diffusion length in a HgCdTe photodiode
    Jung, Han
    Lee, Hee Chul
    Kim, Choong-Ki
    Japanese Journal of Applied Physics, Part 2: Letters, 1996, 35 (10 B):