共 50 条
- [11] A 2 NON-IDENTICAL 3-STATE UNITS REDUNDANT SYSTEM WITH COMMON-CAUSE FAILURES AND ONE STANDBY UNIT MICROELECTRONICS AND RELIABILITY, 1981, 21 (05): : 707 - 709
- [12] Reliability and Performance Modeling for Mission-Oriented k-out-of-n System Under Common Cause Failures PROCEEDINGS OF 2016 11TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS'2016): INTEGRATING BIG DATA, IMPROVING RELIABILITY & SERVING PERSONALIZATION, 2016,
- [13] AN AVAILABILITY ANALYSIS OF A K-OUT-OF-N-G REDUNDANT SYSTEM WITH DEPENDENT FAILURE RATES AND COMMON-CAUSE FAILURES MICROELECTRONICS AND RELIABILITY, 1988, 28 (03): : 391 - 393
- [14] N-UNIT REDUNDANT SYSTEM WITH COMMON-CAUSE FAILURES MICROELECTRONICS AND RELIABILITY, 1979, 19 (04): : 377 - 378
- [16] A 1-OUT-OF-N-G-SYSTEM WITH COMMON-CAUSE FAILURES AND CRITICAL HUMAN ERRORS MICROELECTRONICS AND RELIABILITY, 1991, 31 (05): : 847 - 849
- [17] A RELIABILITY-ANALYSIS OF A K-OUT-OF-N-G REDUNDANT SYSTEM WITH COMMON-CAUSE FAILURES AND CRITICAL HUMAN ERRORS MICROELECTRONICS AND RELIABILITY, 1990, 30 (02): : 237 - 241
- [18] A RELIABILITY-ANALYSIS OF A K-OUT-OF-N-G REDUNDANT SYSTEM WITH THE PRESENCE OF CHANCE COMMON-CAUSE SHOCK FAILURES MICROELECTRONICS AND RELIABILITY, 1992, 32 (10): : 1395 - 1399
- [19] Analysis of k-out-of-n:G systems subject to common cause failures based on Markov process Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics, 2009, 31 (11): : 2789 - 2792