A Study on Infrared Emissivity Measurement of Material Surface by Reflection Method

被引:0
|
作者
Kang, Byung-Chul [1 ]
Kim, Sang-Myoung [1 ]
Choi, Joung-Yoon [1 ]
Kim, Gun-Ok [1 ]
机构
[1] Korea Conform Labs, Weatherproof Technol Team, Cheongwon 363883, Chungbuk, South Korea
关键词
Infrared Thermography; Infrared Emissivity; Reflection Method; FT-IR Steel Plate; Transparent Paint;
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Infrared emissivity is one of the most important factors for the temperature measurement by infrared thermography. Although the infrared emissivity of an object can be measured from the ratio of blackbody and the object, at room temperature it is practically difficult to measure the value due to the background effects. Hence, quantitative reflectance of bare steel plate and the surface of coating was measured by FT-IR spectroscopy and emissivity was calculated from this. The emissivity of polished bare steel surface was from 0.06 to 0.10 and the value for the unpolished bare steel can not be achieved because optical characteristics changes of surface roughness induces erroneous results. Emissivity of transparent paint coated steel was from 0.50 to 0.84. Depends on the IR absorption regions, which is a characteristic value of the coating, emissivity changes. This study suggests surface condition of material, thickness, roughness et cetra are important factor for IR optical characteristics. Emissivity measurement by reflection method is useful technique to be applied for metal and it with coating applied on the surface. The range of experimental errors of temperature can be narrowed by the application of infrared thermography from the measured thermal emissivity.
引用
收藏
页码:484 / 488
页数:5
相关论文
共 50 条
  • [21] MEASUREMENT OF SNOW SURFACE EMISSIVITY
    KONDO, J
    YAMAZAWA, H
    BOUNDARY-LAYER METEOROLOGY, 1986, 34 (04) : 415 - 416
  • [22] Method for accurate measurement of infrared emissivity for opaque low-reflectance materials
    Vishnevetsky, Irina
    Rotenberg, Eyal
    Kribus, Abraham
    Yakir, Dan
    APPLIED OPTICS, 2019, 58 (17) : 4599 - 4609
  • [23] MEASUREMENT OF DIFFUSED SEMICONDUCTOR SURFACE CONCENTRATIINS BY INFRARED PLASMA REFLECTION
    GARDNER, EE
    KAPPALLO, W
    GORDON, CR
    APPLIED PHYSICS LETTERS, 1966, 9 (12) : 432 - &
  • [24] THE METHOD OF WOOD EMISSIVITY MEASUREMENT
    Hrcka, Richard
    Slovackova, Barbora
    ACTA FACULTATIS XYLOLOGIAE ZVOLEN, 2019, 61 (02): : 17 - 24
  • [25] An emissivity measurement apparatus for near infrared spectrum
    Zhang, Feng
    Yu, Kun
    Zhang, Kaihua
    Liu, Yanlei
    Xu, Kaipin
    Liu, Yufang
    INFRARED PHYSICS & TECHNOLOGY, 2015, 73 : 275 - 280
  • [26] Infrared emissivity measurement device: principle and applications
    Ibos, Laurent
    Marchetti, Mario
    Boudenne, Abderrahim
    Datcu, Stefan
    Candau, Yves
    Livet, Jean
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2006, 17 (11) : 2950 - 2956
  • [27] Comparison of the Infrared Surface Emissivity Model (ISEM) with a Physical Emissivity Model
    Hong, Sungwook
    Shin, Inchul
    Ou, Mi-Lim
    JOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY, 2010, 27 (02) : 345 - 352
  • [28] Characteristics evaluation of insolation reflection of high reflection material surface with on-cite measurement
    Grad. School of Eng., Osaka Prefecture Univ., Japan
    AIJ J. Technol. Des., 2009, 29 (159-162):
  • [29] Precision measurement facility of material spectral emissivity
    National Institute of Metrology, Beijing 100013, China
    不详
    Yi Qi Yi Biao Xue Bao, 2008, 8 (1659-1664): : 1659 - 1664
  • [30] Surface temperature measurements on burning materials using an infrared pyrometer: accounting for emissivity and reflection of external radiation
    Urbas, J
    Parker, WJ
    Luebbers, GE
    FIRE AND MATERIALS, 2004, 28 (01) : 33 - 53