HOW DOES ASIC TESTING FIT INTO THE DESIGN PROCESS

被引：0
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作者：
BAGLINO, MA
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来源：
ELECTRONIC DESIGN | 1986年 / 34卷 / 25期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：39 / 40
页数：2
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