SIMPLE LOW-TEMPERATURE TECHNIQUE FOR SCANNING ELECTRON-MICROSCOPY OF CHEESE

被引：0
|
作者：
SCHMIDT, DG [1 ]
HENSTRA, S [1 ]
THIEL, F [1 ]
机构：
[1] TECH PHYS ENGN RES SERV,WAGENINGEN,NETHERLANDS
来源：
MIKROSKOPIE | 1979年 / 35卷 / 1-2期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：50 / 55
页数：6
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