SIMPLE LOW-TEMPERATURE TECHNIQUE FOR SCANNING ELECTRON-MICROSCOPY OF CHEESE

被引：0

|

作者：

SCHMIDT, DG ^{[1
]}

HENSTRA, S ^{[1
]}

THIEL, F ^{[1
]}

机构：

[1] TECH PHYS ENGN RES SERV,WAGENINGEN,NETHERLANDS

来源：

MIKROSKOPIE | 1979年 / 35卷 / 1-2期

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中图分类号：

TH742 [显微镜];

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页码：50 / 55

页数：6

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